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A Targeted Sampling Strategy for Compressive Cryo Focused Ion Beam Scanning Electron Microscopy (2023)

First Author: Nicholls D

Attributed to: RFI Phase 2 funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1109/icassp49357.2023.10096157

Publication URI: http://dx.doi.org/10.1109/icassp49357.2023.10096157

Type: Conference/Paper/Proceeding/Abstract