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The Mechanistic Determination of Doping Contrast from Fermi Level Pinned Surfaces in the Scanning Electron Microscope Using Energy-Filtered Imaging and Calculated Potential Distributions (2022)

First Author: Chee A

Attributed to: Quantitative, high resolution two-and-three dimensional dopant mapping in the Scanning Electron Microscope by Secondary Electron Spectro-Micro funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1017/s1431927622000642

Publication URI: http://dx.doi.org/10.1017/s1431927622000642

Type: Journal Article/Review

Parent Publication: Microscopy and Microanalysis

Issue: 5

ISSN: 14358115 14319276