Study of Thermal Stress in Nano Silver Bonded Silicon Substrates for High Temperature Applications (2019)
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.4071/2380-4491.2019.hiten.000052
Publication URI: http://dx.doi.org/10.4071/2380-4491.2019.hiten.000052
Type: Journal Article/Review
Parent Publication: Additional Conferences (Device Packaging, HiTEC, HiTEN, and CICMT)
Issue: HiTen
ISSN: 22228748