Probing the Emergent Phases in Materials for Quantum Technology via Cryogenic In Situ Biasing 4D-STEM & EELS (2024)
Abstract
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Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1093/mam/ozae044.689
Publication URI: http://dx.doi.org/10.1093/mam/ozae044.689
Type: Journal Article/Review
Parent Publication: Microscopy and Microanalysis
Issue: Supplement_1
ISSN: 14358115 14319276