Studying signal collection in the punch-through protection area of a silicon micro-strip sensor using a micro-focused X-ray beam (2019)
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1016/j.nima.2018.06.085
Publication URI: http://dx.doi.org/10.1016/j.nima.2018.06.085
Type: Journal Article/Review
Parent Publication: Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment
ISSN: 01689002