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Electric field mapping of wide-bandgap semiconductor devices at a submicrometre resolution (2023)

First Author: Cao Y

Attributed to: Sub-micron 3-D Electric Field Mapping in GaN Electronic Devices funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1117/12.2652369

Publication URI: http://dx.doi.org/10.1117/12.2652369

Type: Conference/Paper/Proceeding/Abstract

ISSN: 1996756X 0277786X