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Pushing low thermal conductivity to the limit. (2021)

First Author: Kim SE

Attributed to: X-RAY DIFFRACTION CAPABILITY FOR NANOSCALE AND THIN FILM STRUCTURE funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1126/science.abk1176

PubMed Identifier: 34446593

Publication URI: http://europepmc.org/abstract/MED/34446593

Type: Journal Article/Review

Volume: 373

Parent Publication: Science (New York, N.Y.)

Issue: 6558

ISSN: 0036-8075