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Accessing d-d Excitations Around Misfit Dislocations in Strongly Correlated NiO Thin Films Using High Energy-Resolution EELS (2024)

First Author: Bugnet M
Attributed to:  SuperSTEM: National Research Facility for Advanced Electron Microscopy funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1093/mam/ozae044.753

Publication URI: http://dx.doi.org/10.1093/mam/ozae044.753

Type: Journal Article/Review

Parent Publication: Microscopy and Microanalysis

Issue: Supplement_1

ISSN: 14358115 14319276