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Characterisation of SiOX / SiNX Surface Passivation Using Time-of-Flight Elastic Recoil Detection Analysis (2024)

First Author: Wright M

Attributed to: High Resolution Ion Beam Analysis Facility funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.52825/siliconpv.v2i.1315

Publication URI: http://dx.doi.org/10.52825/siliconpv.v2i.1315

Type: Journal Article/Review

Parent Publication: SiliconPV Conference Proceedings