Photoelectron spectroscopy of ceria: Reduction, quantification and the myth of the vacancy peak in XPS analysis (2023)
Abstract
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Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1002/sia.7254
Publication URI: http://dx.doi.org/10.1002/sia.7254
Type: Journal Article/Review
Parent Publication: Surface and Interface Analysis
Issue: 11