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Photoelectron spectroscopy of ceria: Reduction, quantification and the myth of the vacancy peak in XPS analysis (2023)

First Author: Morgan D

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1002/sia.7254

Publication URI: http://dx.doi.org/10.1002/sia.7254

Type: Journal Article/Review

Parent Publication: Surface and Interface Analysis

Issue: 11