📣 Try out the NEW Gateway to Research and let us know what you think.

We're looking for users to test the new service during August and September and share their feedback. Express your interest by completing this short form.

Characterisation of SiOX / SiNX Surface Passivation Using Time-of-Flight Elastic Recoil Detection Analysis (2024)

First Author: Wright M
Attributed to:  Developing Nanoscale Passivation Layers for Tandem Solar Cell Interfaces: Towards Terawatt-Scale Solar PV funded by Horizon Europe Guarantee

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.52825/siliconpv.v2i.1315

Publication URI: http://dx.doi.org/10.52825/siliconpv.v2i.1315

Type: Journal Article/Review

Parent Publication: SiliconPV Conference Proceedings