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Investigation of the milling characteristics of different focused-ion-beam sources assessed by three-dimensional electron diffraction from crystal lamellae. (2023)

First Author: Parkhurst JM

Attributed to: Cryo-Electron Microscopy Research Infrastructure funded by MRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1107/s2052252523001902

PubMed Identifier: 36952226

Publication URI: http://europepmc.org/abstract/MED/36952226

Type: Journal Article/Review

Volume: 10

Parent Publication: IUCrJ

Issue: Pt 3

ISSN: 2052-2525