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Characterization of analogue Monolithic Active Pixel Sensor test structures implemented in a 65 nm CMOS imaging process (2024)

First Author: Aglieri Rinella G

Attributed to: EIC Detector R&D funded by STFC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1016/j.nima.2024.169896

Publication URI: http://dx.doi.org/10.1016/j.nima.2024.169896

Type: Journal Article/Review

Parent Publication: Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment