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Probing defect formation in sulfur-annealed graphene for TMDC integration (2025)

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1039/d5nr01917f

Publication URI: http://dx.doi.org/10.1039/d5nr01917f

Type: Journal Article/Review

Parent Publication: Nanoscale

Issue: 35

ISSN: 2040-3364