Considerations on the XPS Analysis of 2H-TaS 2 (0001) (2025)
Attributed to:
HarwellXPS: Renewal of NRF in Photoelectron spectroscopy
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1002/sia.70013
Publication URI: http://dx.doi.org/10.1002/sia.70013
Type: Journal Article/Review
Parent Publication: Surface and Interface Analysis
Issue: 10