📣 Try out the NEW Gateway to Research and let us know what you think.

We're looking for users to test the new service during August and September and share their feedback. Express your interest by completing this short form.

Assessing the impact of process and design variations on reliability of complementary FET (2025)

First Author: Dixit A

Attributed to: Probing the States of Single Molecules for Sensing and Multi-value Memory Applications funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1016/j.sse.2025.109226

Publication URI: http://dx.doi.org/10.1016/j.sse.2025.109226

Type: Journal Article/Review

Parent Publication: Solid-State Electronics