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Transmission electron microscopy analysis of atomic layer deposited NbTiN/NbN superconducting thin films (2025)

First Author: Choudhary N

Attributed to: Quantum-Enhanced Interferometry for New Physics funded by SPF

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1063/5.0292737

Publication URI: http://dx.doi.org/10.1063/5.0292737

Type: Journal Article/Review

Parent Publication: APL Materials

Issue: 11