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Fabrication and characterization of boron-terminated tetravacancies in monolayer hBN using STEM, EELS and electron ptychography (2026)

First Author: Byrne D

Attributed to: SuperSTEM: National Research Facility for Advanced Electron Microscopy funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1016/j.ultramic.2025.114305

Publication URI: http://dx.doi.org/10.1016/j.ultramic.2025.114305

Type: Journal Article/Review

Parent Publication: Ultramicroscopy