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Ultrafast mapping in space and time of anisotropic light transport in nanowire mats (2025)

First Author: Burke L

Attributed to: Non-contact scanning probe station for advanced wafer scale testing of photonic integrated circuits funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1063/5.0280658

Publication URI: http://dx.doi.org/10.1063/5.0280658

Type: Journal Article/Review

Parent Publication: APL Photonics

Issue: 10