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Multi-port programmable silicon photonics using low-loss phase change material Sb$_2$Se$_3$ (2025)

First Author: Radford T

Attributed to: Non-contact scanning probe station for advanced wafer scale testing of photonic integrated circuits funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.48550/arxiv.2511.18205

Publication URI: https://arxiv.org/abs/2511.18205

Type: Preprint