A Methodology to Characterize the Virtual Gate Effect in a Power Amplifier (2024)
Attributed to:
ECCS-EPSRC - Advanced III-N Devices and Circuit Architectures for mm-Wave Future-Generation Wireless Communications'
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1109/mapcon61407.2024.10923157
Publication URI: http://dx.doi.org/10.1109/mapcon61407.2024.10923157
Type: Conference/Paper/Proceeding/Abstract