Multiport Programmable Silicon Photonics Using Low-Loss Phase Change Material Sb2Se3. (2026)
Attributed to:
Non-contact scanning probe station for advanced wafer scale testing of photonic integrated circuits
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1021/acs.nanolett.5c05838
PubMed Identifier: 42007606
Publication URI: http://europepmc.org/abstract/MED/42007606
Type: Journal Article/Review
Volume: 26
Parent Publication: Nano letters
Issue: 16
ISSN: 1530-6984