PyMieDiff: A differentiable Mie scattering library (2026)
Attributed to:
Non-contact scanning probe station for advanced wafer scale testing of photonic integrated circuits
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1063/5.0316814
Publication URI: http://dx.doi.org/10.1063/5.0316814
Type: Journal Article/Review
Parent Publication: APL Photonics
Issue: 4