📣 Help Shape the Future of UKRI's Gateway to Research (GtR)

We're improving UKRI's Gateway to Research and are seeking your input! If you would be interested in being interviewed about the improvements we're making and to have your say about how we can make GtR more user-friendly, impactful, and effective for the Research and Innovation community, please email gateway@ukri.org.

The effect of pattern quality on measurements of stress heterogeneity and geometrically necessary dislocation density by high-angular resolution electron backscatter diffraction. (2026)

First Author: Wiesman H

Attributed to: Sir Henry Royce Institute - Cambridge Equipment funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.17863/cam.126853

Publication URI: https://www.repository.cam.ac.uk/handle/1810/397826

Type: Journal Article/Review