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Effects of Varying Substrate Thickness on the Collected Charge From Highly Irradiated Planar Silicon Detectors (2011)

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1109/tns.2011.2171058

Publication URI: http://dx.doi.org/10.1109/tns.2011.2171058

Type: Journal Article/Review

Parent Publication: IEEE Transactions on Nuclear Science

Issue: 6

ISSN: 0018-9499