Noise studies of n-strip on n-bulk silicon microstrip detectors using fast binary readout electronics after irradiation to 3x10 14 p cm -2 (1999)

First Author: Robinson D

Abstract

No abstract provided

Bibliographic Information

Type: Journal Article/Review

Volume: 426

Parent Publication: NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT

Issue: 1

ISSN: 0168-9002