Evaluation of radiation damaged P-in-n and N-in-n silicon microstrip detectors (1999)
Attributed to:
Supplementary funding to support ST/H001093/2
funded by
STFC
Abstract
No abstract provided
Bibliographic Information
Type: Journal Article/Review
Volume: 46
Parent Publication: IEEE TRANSACTIONS ON NUCLEAR SCIENCE
Issue: 6
ISSN: 0018-9499