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Improving the resolution in soft X-ray emission spectrometers through photon-counting using an Electron Multiplying CCD (2012)

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1088/1748-0221/7/01/c01063

Publication URI: http://dx.doi.org/10.1088/1748-0221/7/01/c01063

Type: Journal Article/Review

Parent Publication: Journal of Instrumentation

Issue: 01