Effects of Varying Substrate Thickness on the Collected Charge From Highly Irradiated Planar Silicon Detectors (2011)

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1109/TNS.2011.2171058

Publication URI: http://dx.doi.org/10.1109/TNS.2011.2171058

Type: Journal Article/Review

Volume: 58

Parent Publication: IEEE TRANSACTIONS ON NUCLEAR SCIENCE

Issue: 6

ISSN: 0018-9499