Determination of In Situ Trap Properties in CCDs Using a "Single-Trap Pumping" Technique (2014)

First Author: Hall D
Attributed to:  Simulation and Measurement of Advanced Semiconductor Imaging Sensors funded by STFC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1109/tns.2013.2295941

Publication URI: http://dx.doi.org/10.1109/tns.2013.2295941

Type: Journal Article/Review

Parent Publication: IEEE Transactions on Nuclear Science

Issue: 4