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The use of CCDs and EM-CCDs for future soft x-ray spectrometers (2012)

First Author: Tutt J

Attributed to: Radiation Damage Studies in CCDs and CMOS Imagers, X-ray CCDs for the XEUS Wide Field Imager and CMOS Sensor Development funded by STFC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1117/12.925138

Publication URI: http://dx.doi.org/10.1117/12.925138

Type: Conference/Paper/Proceeding/Abstract