Modelling charge transfer in a radiation damaged charge coupled device for Euclid (2012)

First Author: Hall D
Attributed to:  Simulation and Measurement of Advanced Semiconductor Imaging Sensors funded by STFC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1117/12.925394

Publication URI: http://dx.doi.org/10.1117/12.925394

Type: Conference/Paper/Proceeding/Abstract