Device modelling and model verification for the Euclid CCD273 detector (2012)

First Author: Clarke A
Attributed to:  Simulation and Measurement of Advanced Semiconductor Imaging Sensors funded by STFC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1117/12.925887

Publication URI: http://dx.doi.org/10.1117/12.925887

Type: Conference/Paper/Proceeding/Abstract