The effect of the H:C ratio on the sputtering of molecular solids by fullerenes (2011)
Attributed to:
New Developments in ToF-SIMS Surface Mass Spectrometry with ATR-IR Spectroscopy
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1002/sia.3421
Publication URI: http://dx.doi.org/10.1002/sia.3421
Type: Journal Article/Review
Parent Publication: Surface and Interface Analysis
Issue: 1-2