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The analysis of Si doped hydroxyapatite coatings using FIBSEM, TEM and RHEED

First Author: Edwards H

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1007/978-3-540-85226-1_366

Publication URI: http://dx.doi.org/10.1007/978-3-540-85226-1_366

Type: Book Chapter

Book Title: EMC 2008 14th European Microscopy Congress 1-5 September 2008, Aachen, Germany (2008)

Page Reference: 731-732

ISBN: 978-3-540-85225-4

ISSN: 0019-5413