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Deep level transient spectroscopy study of the effect of Mn and Bi doping on trap formation in ZnO (2010)

First Author: Leach C

Attributed to: SEM-based Technique for Local Property Measurements in Electroceramic Thick/Thin Films: Proof of Principle funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1007/s10832-010-9614-7

Publication URI: http://dx.doi.org/10.1007/s10832-010-9614-7

Type: Journal Article/Review

Parent Publication: Journal of Electroceramics

Issue: 2-4