Modelling the deformation of a confectionery wafer as a non-uniform sandwich structure (2012)
Attributed to:
Microstructural characterisation of complex materials using advanced Scanning Electron Microscope (SEM) techniques
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1007/s10853-012-7034-6
Publication URI: http://dx.doi.org/10.1007/s10853-012-7034-6
Type: Journal Article/Review
Parent Publication: Journal of Materials Science
Issue: 6