Probing Deformation and Revealing Microstructural Mechanisms with Cross-Correlation-Based, High-Resolution Electron Backscatter Diffraction (2013)

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1007/s11837-013-0680-6

Publication URI: http://dx.doi.org/10.1007/s11837-013-0680-6

Type: Journal Article/Review

Parent Publication: JOM

Issue: 9