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Simulations of C60 bombardment of Si, SiC, diamond and graphite (2008)

First Author: Krantzman K

Attributed to: New Developments in ToF-SIMS Surface Mass Spectrometry with ATR-IR Spectroscopy funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1016/j.apsusc.2008.05.236

Publication URI: http://dx.doi.org/10.1016/j.apsusc.2008.05.236

Type: Journal Article/Review

Parent Publication: Applied Surface Science

Issue: 4