Image-based modelling of binary composites (2012)
Attributed to:
Microstructural characterisation of complex materials using advanced Scanning Electron Microscope (SEM) techniques
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1016/j.commatsci.2012.02.046
Publication URI: http://dx.doi.org/10.1016/j.commatsci.2012.02.046
Type: Journal Article/Review
Parent Publication: Computational Materials Science