X-ray nano computerised tomography of SOFC electrodes using a focused ion beam sample-preparation technique (2010)
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1016/j.jeurceramsoc.2010.02.004
Publication URI: http://dx.doi.org/10.1016/j.jeurceramsoc.2010.02.004
Type: Journal Article/Review
Parent Publication: Journal of the European Ceramic Society
Issue: 8