X-ray nano computerised tomography of SOFC electrodes using a focused ion beam sample-preparation technique (2010)

First Author: Shearing P

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1016/j.jeurceramsoc.2010.02.004

Publication URI: http://dx.doi.org/10.1016/j.jeurceramsoc.2010.02.004

Type: Journal Article/Review

Parent Publication: Journal of the European Ceramic Society

Issue: 8