Low voltage STEM imaging of multi-walled carbon nanotubes. (2012)
Attributed to:
An Advanced SEM-FIB Dual Beam Microscope for Three-Dimensional Mesoscale Fabrication, Imaging and Analysis
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1016/j.micron.2011.10.016
PubMed Identifier: 22133973
Publication URI: http://europepmc.org/abstract/MED/22133973
Type: Journal Article/Review
Volume: 43
Parent Publication: Micron (Oxford, England : 1993)
Issue: 2-3
ISSN: 0968-4328