Modelling deformation and fracture in confectionery wafers (2011)
Attributed to:
Microstructural characterisation of complex materials using advanced Scanning Electron Microscope (SEM) techniques
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1016/j.profoo.2011.09.076
Publication URI: http://dx.doi.org/10.1016/j.profoo.2011.09.076
Type: Journal Article/Review
Parent Publication: Procedia Food Science