Effect of layer thickness on structural quality of Ge epilayers grown directly on Si(001) (2011)
Attributed to:
On-Chip milliKelvin Electronic Refrigerator for Astronomical and Quantum Device Applications
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1016/j.tsf.2011.06.022
Publication URI: http://dx.doi.org/10.1016/j.tsf.2011.06.022
Type: Journal Article/Review
Parent Publication: Thin Solid Films
Issue: 22