Low-voltage cross-sectional EBIC for characterisation of GaN-based light emitting devices. (2007)
Attributed to:
Materials Challenges in GaN-based Light Emitting Structures
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1016/j.ultramic.2006.10.002
PubMed Identifier: 17126490
Publication URI: http://europepmc.org/abstract/MED/17126490
Type: Journal Article/Review
Volume: 107
Parent Publication: Ultramicroscopy
Issue: 4-5
ISSN: 0304-3991