Low-voltage cross-sectional EBIC for characterisation of GaN-based light emitting devices. (2007)

First Author: Moldovan G

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1016/j.ultramic.2006.10.002

PubMed Identifier: 17126490

Publication URI: http://europepmc.org/abstract/MED/17126490

Type: Journal Article/Review

Volume: 107

Parent Publication: Ultramicroscopy

Issue: 4-5

ISSN: 0304-3991