Factors affecting the accuracy of high resolution electron backscatter diffraction when using simulated patterns. (2010)
Attributed to:
Effective Structural Unit Size in Polycrystals: Formation, Quantification and Micromechanical Behaviour
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1016/j.ultramic.2010.08.001
PubMed Identifier: 20888125
Publication URI: http://europepmc.org/abstract/MED/20888125
Type: Journal Article/Review
Volume: 110
Parent Publication: Ultramicroscopy
Issue: 12
ISSN: 0304-3991