Atom probe tomography and transmission electron microscopy of a Mg-doped AlGaN/GaN superlattice. (2011)
Attributed to:
An Advanced SEM-FIB Dual Beam Microscope for Three-Dimensional Mesoscale Fabrication, Imaging and Analysis
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1016/j.ultramic.2010.11.028
PubMed Identifier: 21333858
Publication URI: http://europepmc.org/abstract/MED/21333858
Type: Journal Article/Review
Volume: 111
Parent Publication: Ultramicroscopy
Issue: 3
ISSN: 0304-3991