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High throughput X-ray diffraction analysis of combinatorial polycrystalline thin film libraries. (2010)

First Author: Roncallo S

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1021/ac100572h

PubMed Identifier: 20443552

Publication URI: http://europepmc.org/abstract/MED/20443552

Type: Journal Article/Review

Volume: 82

Parent Publication: Analytical chemistry

Issue: 11

ISSN: 0003-2700