C60+ secondary ion microscopy using a delay line detector. (2010)

First Author: Klerk LA
Attributed to:  Enhancing new developments in ToF-SIMS through researcher exchanges funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1021/ac902587g

PubMed Identifier: 20043656

Publication URI: http://europepmc.org/abstract/MED/20043656

Type: Journal Article/Review

Volume: 82

Parent Publication: Analytical chemistry

Issue: 3

ISSN: 0003-2700